Universal distribution of transparencies in highly conductive Nb/AlOx/Nb junctions

Y. Naveh; Vijay Patel; D. V. Averin; K. K. Likharev; J. E. Lukens

doi:10.1103/PhysRevLett.85.5404

Universal distribution of transparencies in highly conductive Nb/AlO_x/Nb junctions

Y. Naveh
, Vijay Patel
, D. V. Averin
, K. K. Likharev
, J. E. Lukens

Physics and Astronomy

Stony Brook University
IBM

Research output: Contribution to journal › Article › peer-review

69 Scopus citations

Abstract

Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.

Original language	English
Pages (from-to)	5404-5407
Number of pages	4
Journal	Physical Review Letters
Volume	85
Issue number	25
DOIs	https://doi.org/10.1103/PhysRevLett.85.5404
State	Published - Dec 18 2000

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10.1103/PhysRevLett.85.5404

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title = "Universal distribution of transparencies in highly conductive Nb/AlOx/Nb junctions",

abstract = "Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.",

author = "Y. Naveh and Vijay Patel and Averin, \{D. V.\} and Likharev, \{K. K.\} and Lukens, \{J. E.\}",

year = "2000",

month = dec,

day = "18",

doi = "10.1103/PhysRevLett.85.5404",

language = "English",

volume = "85",

pages = "5404--5407",

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AU - Naveh, Y.

AU - Patel, Vijay

AU - Averin, D. V.

AU - Likharev, K. K.

AU - Lukens, J. E.

PY - 2000/12/18

Y1 - 2000/12/18

N2 - Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.

AB - Aluminum oxide barrier samples were fabricated in situ from Nb/Al/Nb trilayers. It was shown through experimental dc IV curves of two junctions of different areas with the Josephson critical current suppressed by a magnetic field that the data agrees with the Schep-Bauer distribution.

UR - https://www.scopus.com/pages/publications/18544410907

U2 - 10.1103/PhysRevLett.85.5404

DO - 10.1103/PhysRevLett.85.5404

M3 - Article

AN - SCOPUS:18544410907

SN - 0031-9007

VL - 85

SP - 5404

EP - 5407

JO - Physical Review Letters

JF - Physical Review Letters

IS - 25

ER -

Universal distribution of transparencies in highly conductive Nb/AlO_x/Nb junctions

Abstract

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