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X-ray microscopy in polymer science: prospects of a 'new' imaging technique

  • H. Ade
  • , A. P. Smith
  • , S. Cameron
  • , R. Cieslinski
  • , G. Mitchell
  • , B. Hsiao
  • , E. Rightor
  • North Carolina State University
  • ExxonMobil
  • Dow Chemical

Research output: Contribution to journalArticlepeer-review

51 Scopus citations

Abstract

A relatively non-invasive imaging technique, which employs highly focused, tunable X-rays, is described. This technique-scanning transmission X-ray microscopy-can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50nm. We present examples ranging from unoriented multiplase polymers to highly oriented Kevlar fibres. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of bulk samples is discussed.

Original languageEnglish
Pages (from-to)1843-1848
Number of pages6
JournalPolymer
Volume36
Issue number9
DOIs
StatePublished - Apr 1995

Keywords

  • bulk characteristics
  • STXM
  • X-ray microscopy

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