Abstract
A relatively non-invasive imaging technique, which employs highly focused, tunable X-rays, is described. This technique-scanning transmission X-ray microscopy-can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50nm. We present examples ranging from unoriented multiplase polymers to highly oriented Kevlar fibres. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of bulk samples is discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 1843-1848 |
| Number of pages | 6 |
| Journal | Polymer |
| Volume | 36 |
| Issue number | 9 |
| DOIs | |
| State | Published - Apr 1995 |
Keywords
- bulk characteristics
- STXM
- X-ray microscopy
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