X-ray microscopy of polymeric materials

H. Ade; B. Hsiao; G. Mitchell; E. Rightor; A. P. Smith; R. Cieslinski

X-ray microscopy of polymeric materials

H. Ade
, B. Hsiao
, G. Mitchell
, E. Rightor
, A. P. Smith
, R. Cieslinski

Chemistry

North Carolina State University

Research output: Contribution to journal › Conference article › peer-review

5 Scopus citations

Abstract

We describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.

Original language	English
Pages (from-to)	293-302
Number of pages	10
Journal	Materials Research Society Symposium - Proceedings
Volume	375
State	Published - 1995
Event	Proceedings of the 1994 MRS Fall Meeting - Boston, MA, USA Duration: Nov 28 1994 → Dec 1 1994

Cite this

@article{df5c68a8b8854f24b1f957c5c5ae39d9,

title = "X-ray microscopy of polymeric materials",

abstract = "We describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.",

author = "H. Ade and B. Hsiao and G. Mitchell and E. Rightor and Smith, \{A. P.\} and R. Cieslinski",

year = "1995",

language = "English",

volume = "375",

pages = "293--302",

journal = "Materials Research Society Symposium - Proceedings",

issn = "0272-9172",

note = "Proceedings of the 1994 MRS Fall Meeting ; Conference date: 28-11-1994 Through 01-12-1994",

}

TY - JOUR

T1 - X-ray microscopy of polymeric materials

AU - Ade, H.

AU - Hsiao, B.

AU - Mitchell, G.

AU - Rightor, E.

AU - Smith, A. P.

AU - Cieslinski, R.

PY - 1995

Y1 - 1995

N2 - We describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.

AB - We describe how the scanning transmission x-ray microscope at Brookhaven National Laboratory can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiphase polymers to highly oriented Kevlar fibers. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of thick samples is discussed.

UR - https://www.scopus.com/pages/publications/0029220014

M3 - Conference article

AN - SCOPUS:0029220014

SN - 0272-9172

VL - 375

SP - 293

EP - 302

JO - Materials Research Society Symposium - Proceedings

JF - Materials Research Society Symposium - Proceedings

T2 - Proceedings of the 1994 MRS Fall Meeting

Y2 - 28 November 1994 through 1 December 1994

ER -

X-ray microscopy of polymeric materials

Abstract

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