TY - GEN
T1 - X-ray topography
AU - Dudley, Michael
PY - 1993
Y1 - 1993
N2 - A review of the technique of White Beam Synchrotron X-ray Topography is presented along with some examples of its applications in materials science. Among the topics covered are: the characterization of growth defects in KTiOPO4, ZnTc, and SiC single crystals; studies of phase transitions in perovskite-like crystals; and studies of rapid thermal processing damage in semiconductors. Methodologies for analyzing dislocations, twins (rotational, mirror and inversion twins), precipitates and other crystallographic defects, will be reviewed.
AB - A review of the technique of White Beam Synchrotron X-ray Topography is presented along with some examples of its applications in materials science. Among the topics covered are: the characterization of growth defects in KTiOPO4, ZnTc, and SiC single crystals; studies of phase transitions in perovskite-like crystals; and studies of rapid thermal processing damage in semiconductors. Methodologies for analyzing dislocations, twins (rotational, mirror and inversion twins), precipitates and other crystallographic defects, will be reviewed.
UR - https://www.scopus.com/pages/publications/0027167975
U2 - 10.1557/proc-307-213
DO - 10.1557/proc-307-213
M3 - Conference contribution
AN - SCOPUS:0027167975
SN - 1558992030
SN - 9781558992030
T3 - Materials Research Society Symposium Proceedings
SP - 213
EP - 224
BT - Applications of Synchrotron Radiation Techniques to Materials Science
PB - Publ by Materials Research Society
T2 - Materials Research Society Spring Meeting
Y2 - 12 April 1993 through 15 April 1993
ER -