X-ray topography

Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review

Original language	English
Title of host publication	Microprobe Characterization of Optoelectronic Materials
Publisher	CRC Press
Pages	531-594
Number of pages	64
ISBN (Electronic)	9781040283820
ISBN (Print)	9781560329411
DOIs	https://doi.org/10.1201/9781003578673-7
State	Published - Nov 1 2024

Access to Document

@inbook{4723906d216c499fbb0cbb672c57f387,

title = "X-ray topography",

author = "Michael Dudley and Xianrong Huang",

year = "2024",

month = nov,

day = "1",

doi = "10.1201/9781003578673-7",

language = "English",

isbn = "9781560329411",

pages = "531--594",

booktitle = "Microprobe Characterization of Optoelectronic Materials",

publisher = "CRC Press",

}

TY - CHAP

T1 - X-ray topography

AU - Dudley, Michael

AU - Huang, Xianrong

PY - 2024/11/1

Y1 - 2024/11/1

UR - https://www.scopus.com/pages/publications/85206223311

U2 - 10.1201/9781003578673-7

DO - 10.1201/9781003578673-7

M3 - Chapter

AN - SCOPUS:85206223311

SN - 9781560329411

SP - 531

EP - 594

BT - Microprobe Characterization of Optoelectronic Materials

PB - CRC Press

ER -